An angle-resolved X-ray photoelectron spectroscopy (ARXPS) method is first introduced for elucidation of the mechanism of Te substitution by Se in Sb,Te, crystals. The obtained results are consistent with the substitution of the selenium atoms predominantly into the Te, atomic layers. The observed s
✦ LIBER ✦
Substitutional defects in Sb2Te3 crystals
✍ Scribed by Lošťák, P. ;Starý, Z. ;Horák, J. ;Pancíř, J.
- Publisher
- John Wiley and Sons
- Year
- 1989
- Tongue
- English
- Weight
- 614 KB
- Volume
- 115
- Category
- Article
- ISSN
- 0031-8965
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