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Stress Effects on the Switching Voltage of Metal-SnO2-Si(n)-Si(p+) Devices

✍ Scribed by Phan, H. K. ;Phu, L. H. ;Chiem, C. V.

Publisher: John Wiley and Sons
Year: 1983
Tongue: English
Weight: 167 KB
Volume: 79
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210790145

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