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Stress Effect on Critical Thickness in Ferroelectric Thin Films

✍ Scribed by Zhang, Jian; Wu, Zhenhuai; Yin, Zhen; Zhang, Ming-Sheng


Book ID
125535865
Publisher
Taylor and Francis Group
Year
2002
Tongue
English
Weight
90 KB
Volume
43
Category
Article
ISSN
1058-4587

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