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Stress effects in ferroelectric thin films

✍ Scribed by J.S. Zhu; X.M. Lu; P. Li; W. Jiang; Y.N. Wang

Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 383 KB
Volume: 101
Category: Article
ISSN: 0038-1098
DOI: 10.1016/s0038-1098(96)00545-5

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