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Strain relief process at highly strained semiconductor heterointerfaces studied by high-resolution X-ray diffraction

โœ Scribed by L. Tapfer; G.E. Crook; O. Brandt; K. Ploog


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
304 KB
Volume
56-58
Category
Article
ISSN
0169-4332

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