Strain relaxation and misfit dislocations in compositionally graded Si1 − xGex layers on Si(001)

✍ Scribed by J.H. Li; V. Holy; G. Bauer; M. Hohnisch; H.-J. Herzog; F. Schäffler

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 350 KB
• Volume: 157
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(95)00402-5