Dislocation patterning and nanostructure engineering in compositionally graded Si1 − xGexSi layer systems

✍ Scribed by S.Yu. Shiryaev; F. Jensen; J.Wulff Petersen; J.Lundsgaard Hansen; A.Nylandsted Larsen

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 337 KB
• Volume: 157
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(95)00381-9