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Strain-driven defect evolution in Sn+ implanted Si/SiGe multilayer structure

โœ Scribed by P.I. Gaiduk; A. Nylandsted Larsen; W. Wesch


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
312 KB
Volume
267
Category
Article
ISSN
0168-583X

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