Strain dependence of hole effective mass and scattering mechanism in strained Ge channel structures

✍ Scribed by Sawano, K.; Toyama, K.; Masutomi, R.; Okamoto, T.; Usami, N.; Arimoto, K.; Nakagawa, K.; Shiraki, Y.

• Book ID: 120657859
• Publisher: American Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 306 KB
• Volume: 95
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3229998