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Step-stress testing of thin film transistors : E. Schlam, J. Velasquez and I. Reingold. Proc. IEEE 24th Electronic Components Conference, Washington D.C. 43 (13–15 May 1974)

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 118 KB
Volume: 14
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(75)90431-x

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