Real time detection of microcracks in brittle materials using stress wave emission (SWE) : S. J. Vahaviolos. Proc. IEEE 24th Electronic Components Conference. Washington, D.C. 34 (13–15 May 1974)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 120 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90434-5