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Statistics of Resistance Drift Due to Structural Relaxation in Phase-Change Memory Arrays

✍ Scribed by Boniardi, M.; Ielmini, D.; Lavizzari, S.; Lacaita, A.L.; Redaelli, A.; Pirovano, A.


Book ID
114620120
Publisher
IEEE
Year
2010
Tongue
English
Weight
731 KB
Volume
57
Category
Article
ISSN
0018-9383

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