Size-Dependent Drift of Resistance Due to Surface Defect Relaxation in Conductive-Bridge Memory

✍ Scribed by Choi, S.; Balatti, S.; Nardi, F.; Ielmini, D.

• Book ID: 119799746
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 277 KB
• Volume: 33
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2012.2199074