Statistical evaluation of random telegra
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H.H. Mueller; M. Schulz
📂
Article
📅
1997
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Elsevier Science
🌐
English
⚖ 271 KB
The amplitudes of random telegraph signals (RTSs) caused by individual traps at the Si-SiO 2 interface of sub-pm MOSFETs depend on the channel non-uniformities and, in particular, on the current distribution in the immediate vicinity of the trap. We find that to a good approximation an RTS amplitude