Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique

✍ Scribed by N. Sghaier; L. Militaru; M. Trabelsi; N. Yacoubi; A. Souifi

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 200 KB
• Volume: 38
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/j.mejo.2007.02.003