✦ LIBER ✦

Statistical modeling of MOS devices for parametric yield prediction

✍ Scribed by Juin J. Liou; Qiang Zhang; John McMacken; J.Ross Thomson; Kevin Stiles; Paul Layman

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Statistical modeling for efficient param

✍ Cox, P.; Ping Yang; Mahant-Shetti, S.S.; Chatterjee, P. 📂 Article 📅 1985 🏛 IEEE 🌐 English ⚖ 745 KB

Statistical Timing for Parametric Yield

✍ Jess, J.A.G.; Kalafala, K.; Naidu, S.R.; Otten, R.H.J.M.; Visweswariah, C. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 535 KB

Parametric Yield Optimization of MOS IC'

✍ Massimo Conti; Paolo Crippa; Simone Orcioni; Claudio Turchetti 📂 Article 📅 2001 🏛 Springer 🌐 English ⚖ 264 KB

Comparison of charge yield in MOS device

✍ Paillet, P.; Schwank, J.R.; Shaneyfelt, M.R.; Ferlet-Cavrois, V.; Jones, R.L.; F 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 382 KB

Statistical Modeling of Semiconductor De

✍ Messenger, George C.; Steele, Earl L. 📂 Article 📅 1968 🏛 IEEE 🌐 English ⚖ 978 KB

Parametric yield optimization of CMOS an

✍ T. K. Yu; S. M. Kang; J. Sacks; W. J. Welch 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 756 KB