𝔖 Bobbio Scriptorium

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Parametric Yield Optimization of MOS IC's Affected by Device Mismatch

✍ Scribed by Massimo Conti; Paolo Crippa; Simone Orcioni; Claudio Turchetti

Book ID: 110298567
Publisher: Springer
Year: 2001
Tongue: English
Weight: 264 KB
Volume: 29
Category: Article
ISSN: 0925-1030
DOI: 10.1023/a:1011213414261

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