Comparison of charge yield in MOS devices for different radiation sources

✍ Scribed by Paillet, P.; Schwank, J.R.; Shaneyfelt, M.R.; Ferlet-Cavrois, V.; Jones, R.L.; Flament, O.; Blackmore, E.W.

• Book ID: 111687155
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 382 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2002.805438