Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates

✍ Scribed by Rita Van Ham; Luc Van Vaeck; Annemie Adriaens; Freddy Adams; Brittany Hodges; Anita Gianotto; Recep Avci; Anthony Appelhans; Gary Groenewold

• Book ID: 116901492
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 480 KB
• Volume: 69
• Category: Article
• ISSN: 0039-9140
• DOI: 10.1016/j.talanta.2005.09.012