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Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

✍ Scribed by S. N. Morozov, U. Kh. Rasulev

Book ID: 120810254
Publisher: Springer
Year: 2013
Tongue: English
Weight: 203 KB
Volume: 58
Category: Article
ISSN: 1063-7842
DOI: 10.1134/S1063784213060224

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