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Static noise analysis for digital integrated circuits in partially depleted silicon-on-insulator technology

✍ Scribed by Chan, S.C.; Shepard, K.L.; Dae-Jin Kim

Book ID: 118698284
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 381 KB
Volume: 21
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2002.800461

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