๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Standard sample for calibration of transmission electron microscopes nanometrology

โœ Scribed by D. S. Bodunov, V. P. Gavrilenko, A. V. Zablotskii, A. A. Kuzin, A. Yu. Kuzin, V. B. Mityukhlyaev, A. V. Rakov, P. A. Todua, M. N. Filippov

Book ID
118806074
Publisher
Springer US
Year
2012
Tongue
English
Weight
190 KB
Volume
55
Category
Article
ISSN
0543-1972

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

A transmission electron microscope (TEM)
A transmission electron microscope (TEM) calibration standard sample for all magnification, camera constant, and image/diffraction pattern rotation calibrations
โœ J. P. McCaffrey; J.-M. Baribeau ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 811 KB

A calibration sample for transmission electron microscopy (TEM) has been developed that performs the three major instrument calibrations for a transmission electron microscope: the image magnification calibration for measurements of images, the camera constant calibration for indexing diffraction pa

A variation of transmission electron mic
A variation of transmission electron microscope sample preparation for VLSI analysis
โœ Madden, Michael C. ;Crafard, Penny ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 593 KB

Sample preparation for VLSI analysis is often slow due to long ion milling time and because the location of the thin area of the sample is difficult to control. By modifying the standard techniques used with a VCR Group (and perhaps other) mechanical dimpler, the ion milling time can be reduced to l