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Stabilization of Structure–Impurity and Electrophysical Parameters in the Si/SiO2 System

✍ Scribed by N. Ya. Zaitsev; G. Ya. Krasnikov; I. V. Matyushkin

Book ID
111567428
Publisher
Springer
Year
2000
Tongue
English
Weight
41 KB
Volume
29
Category
Article
ISSN
1063-7397

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