𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Influence of backside implantation on the impurity concentration in the Si-SiO2 system

✍ Scribed by Kaschieva, S.

Book ID
105382509
Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
135 KB
Volume
123
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

The peculiarities of Si/SiO2 interfaces
The peculiarities of Si/SiO2 interfaces in the Si–SiO2 systems with Si nanocrystals
✍ T. Kryshtab; G. GΓ³mez Gasga; N. Korsunska; M. Baran; S. Kirillova; L. Khomenkova πŸ“‚ Article πŸ“… 2010 πŸ› Elsevier Science 🌐 English βš– 281 KB

Si-rich-SiO 2 layers with excess silicon of 45-50% were grown by RF magnetron co-sputtering from pure SiO 2 and Si targets and were studied by Raman scattering, HRTEM, electron-paramagnetic resonance and X-ray diffraction (XRD) methods as well as by photo-voltage technique operated at different temp

On the state of Mn impurity implanted in
On the state of Mn impurity implanted in Si
✍ A. F. Orlov; V. T. Bublik; V. I. Vdovin; Yu. A. Agafonov; L. A. Balagurov; V. I. πŸ“‚ Article πŸ“… 2009 πŸ› SP MAIK Nauka/Interperiodica 🌐 English βš– 200 KB