✦ LIBER ✦

Sputter depth profiling of thin films with LEIS and LENRS

✍ Scribed by S.G. Puranik; B.V. King

Book ID: 107925596
Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 401 KB
Volume: 28
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(87)90063-8

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