✦ LIBER ✦

Significance of sample rotation in auger electronspectroscopy sputter depth profiling of thin films

✍ Scribed by A. Zalar

Book ID: 114085802
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 658 KB
Volume: 193-194
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(05)80035-5

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