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SPIE Proceedings [SPIE Workshop on Nanostructure Science, Metrology, and Technology - Gaithersburg, MD (Wednesday 5 September 2001)] Nanostructure Science, Metrology, and Technology - The challenge of nanometrology

✍ Scribed by Postek, Jr., Michael T.; Peckerar, Martin C.; Postek, Jr., Michael T.

No coin nor oath required. For personal study only.

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