SPIE Proceedings [SPIE Workshop on Nanostructure Science, Metrology, and Technology - Gaithersburg, MD (Wednesday 5 September 2001)] Nanostructure Science, Metrology, and Technology - Fractal characterization of nanoscale powder agglomerates

✍ Scribed by Manickavasagam, Siva; Saltiel, Craig; Menguec, M. P.; Sadowski, Martin L.; Drozdowicz, Zbigniew M.; Peckerar, Martin C.; Postek, Jr., Michael T.

• Book ID: 120733626
• Publisher: SPIE
• Year: 2002
• Weight: 1000 KB
• Volume: 4608
• Category: Article
• DOI: 10.1117/12.438491