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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Crystal and Multilayer Optics - Doubly focusing crystal analyzer for x-ray fluorescence holography

✍ Scribed by Marchesini, Stefano; Belakhovsky, Michel; Freund, Andreas K.; Macrander, Albert T.; Freund, Andreas K.; Ishikawa, Tetsuya; Mills, Dennis M.

Book ID: 121481083
Publisher: SPIE
Year: 1998
Weight: 802 KB
Volume: 3448
Category: Article
DOI: 10.1117/12.332510

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