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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Crystal and Multilayer Optics - High-resolution large-acceptance analyzer for x-ray fluorescence and Raman spectroscopy

✍ Scribed by Bergmann, Uwe; Cramer, Stephen P.; Macrander, Albert T.; Freund, Andreas K.; Ishikawa, Tetsuya; Mills, Dennis M.

Book ID: 120450532
Publisher: SPIE
Year: 1998
Weight: 531 KB
Volume: 3448
Category: Article
DOI: 10.1117/12.332507

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