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SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] X-Ray and Extreme Ultraviolet Optics - Structural analysis of multilayered x-ray mirrors by x-ray diffraction

✍ Scribed by Kim, Dong-Eon; Cha, DongHo; Hoover, Richard B.; Walker, Jr., Arthur B. C.

Book ID: 120614499
Publisher: SPIE
Year: 1995
Weight: 255 KB
Volume: 2515
Category: Article
DOI: 10.1117/12.212585

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