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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Polarization Analysis and Measurement II - Polarization sensitivity modeling of reflective imaging systems

✍ Scribed by Wells, Conrad; Goldstein, Dennis H.; Chenault, David B.

No coin nor oath required. For personal study only.

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