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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Infrared Technology XX - Challenges in IR system testing

✍ Scribed by Holst, Gerald C.; Andresen, Bjorn F.

Book ID: 120449227
Publisher: SPIE
Year: 1994
Weight: 231 KB
Volume: 2269
Category: Article
DOI: 10.1117/12.188677

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