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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Polarization Analysis and Measurement II - Birefringent characteristics of two new crystalline materials: CeF3 and LaF3

โœ Scribed by Derks, Michael J.; Kopp, Greg A.; Goldstein, Dennis H.; Chenault, David B.


Book ID
118120196
Publisher
SPIE
Year
1994
Weight
160 KB
Volume
2265
Category
Article

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