SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 16 April 2012)] Optical Micro- and Nanometrology IV - Sub-micron resolution high-speed spectral domain optical coherence tomography in quality inspection for printed electronics

✍ Scribed by Czajkowski, J.; Lauri, J.; Sliz, R.; Fält, P.; Fabritius, T.; Myllylä, R.; Cense, B.; Gorecki, Christophe; Asundi, Anand K.; Osten, Wolfgang

• Book ID: 120760109
• Publisher: SPIE
• Year: 2012
• Weight: 933 KB
• Volume: 8430
• Category: Article
• DOI: 10.1117/12.922443