SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 16 April 2012)] Optical Micro- and Nanometrology IV - Electron spin resonance characterization of defects in sensor materials based on nanocrystalline tin dioxide

✍ Scribed by Grishina, D. A.; Mironov, A. A.; Pentegov, I. S.; Marikutsa, A. V.; Konstantinova, E. A.; Gorecki, Christophe; Asundi, Anand K.; Osten, Wolfgang

• Book ID: 120331928
• Publisher: SPIE
• Year: 2012
• Weight: 329 KB
• Volume: 8430
• Category: Article
• DOI: 10.1117/12.923460