𝔖 Bobbio Scriptorium

✦ LIBER ✦

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Gallium Nitride Materials and Devices VIII - Investigation of droop-causing mechanisms in GaN-based devices using fully microscopic many-body theory

✍ Scribed by Hader, J.; Moloney, J. V.; Koch, S. W.; Chyi, Jen-Inn; Nanishi, Yasushi; Morkoç, Hadis; Piprek, Joachim; Yoon, Euijoon; Fujioka, Hiroshi

Book ID: 120181441
Publisher: SPIE
Year: 2013
Weight: 898 KB
Volume: 8625
Category: Article
DOI: 10.1117/12.2005134

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

SPIE Proceedings [SPIE SPIE OPTO - San F

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Gallium Nitride Materials and Devices VIII - X-ray detectors based on GaN

✍ Duboz, J. Y.; Frayssinet, E.; Chenot, Sebastien; Reverchon, J. L.; Idir, M.; Chy 📂 Article 📅 2013 🏛 SPIE ⚖ 327 KB

SPIE Proceedings [SPIE SPIE OPTO - San F

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Gallium Nitride Materials and Devices VIII - HVPE-GaN growth on ammonothermal GaN crystals

✍ Sochacki, Tomasz; Amilusik, Mikolaj; Lucznik, Boleslaw; Boćkowski, Michal; Weyhe 📂 Article 📅 2013 🏛 SPIE ⚖ 885 KB

SPIE Proceedings [SPIE SPIE OPTO - San F

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Gallium Nitride Materials and Devices VIII - Defects in nitrides, positron annihilation spectroscopy

✍ Tuomisto, Filip; Chyi, Jen-Inn; Nanishi, Yasushi; Morkoç, Hadis; Piprek, Joachim 📂 Article 📅 2013 🏛 SPIE ⚖ 681 KB

SPIE Proceedings [SPIE SPIE OPTO - San F

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Gallium Nitride Materials and Devices VIII - Short period InN/ n GaN superlattices: experiment versus theory

✍ Suski, T.; Gorczyca, I.; Staszczak, G.; Wang, X. Q.; Christensen, N. E.; Svane, 📂 Article 📅 2013 🏛 SPIE ⚖ 399 KB

SPIE Proceedings [SPIE SPIE OPTO - San F

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Gallium Nitride Materials and Devices VIII - Junction temperature measurements and reliability of GaN FETs

✍ Kuball, Martin; Pomeroy, James W.; Montes Bajo, Miguel; Silvestri, Marco; Uren, 📂 Article 📅 2013 🏛 SPIE ⚖ 991 KB

SPIE Proceedings [SPIE SPIE OPTO - San F

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Gallium Nitride Materials and Devices VIII - Nonpolar and semipolar GaN, optical gain and efficiency

✍ Park, Seoung-Hwan; Ahn, Doyeol; Chyi, Jen-Inn; Nanishi, Yasushi; Morkoç, Hadis; 📂 Article 📅 2013 🏛 SPIE ⚖ 627 KB