SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Gallium Nitride Materials and Devices VIII - X-ray detectors based on GaN

✍ Scribed by Duboz, J. Y.; Frayssinet, E.; Chenot, Sebastien; Reverchon, J. L.; Idir, M.; Chyi, Jen-Inn; Nanishi, Yasushi; Morkoç, Hadis; Piprek, Joachim; Yoon, Euijoon; Fujioka, Hiroshi

• Book ID: 120339679
• Publisher: SPIE
• Year: 2013
• Weight: 327 KB
• Volume: 8625
• Category: Article
• DOI: 10.1117/12.2007827