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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Gallium Nitride Materials and Devices VIII - Junction temperature measurements and reliability of GaN FETs

✍ Scribed by Kuball, Martin; Pomeroy, James W.; Montes Bajo, Miguel; Silvestri, Marco; Uren, Michael J.; Killat, Nicole; Chyi, Jen-Inn; Nanishi, Yasushi; Morkoç, Hadis; Piprek, Joachim; Yoon, Euijoon; Fujioka, Hiroshi

Book ID: 120312095
Publisher: SPIE
Year: 2013
Weight: 991 KB
Volume: 8625
Category: Article
DOI: 10.1117/12.2007817

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