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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optics for Arts, Architecture, and Archaeology IV - Extending hyperspectral imaging from Vis to NIR spectral regions: a novel scanner for the in-depth analysis of polychrome surfaces

✍ Scribed by Cucci, Costanza; Pezzati, Luca; Targowski, Piotr; Casini, Andrea; Picollo, Marcello; Stefani, Lorenzo

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