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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optics for Arts, Architecture, and Archaeology IV - A multi-analytical investigation of semi-conductor pigments with time-resolved spectroscopy and imaging

✍ Scribed by Nevin, A.; Pezzati, Luca; Targowski, Piotr; Cesaratto, A.; D'Andrea, C.; Valentini, Gianluca; Comelli, D.

No coin nor oath required. For personal study only.

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