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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optics for Arts, Architecture, and Archaeology IV - Multispectral light metering system for cultural heritage diagnosis and conservation

✍ Scribed by Miccoli, Matteo; Pezzati, Luca; Targowski, Piotr; Melis, Marcello

No coin nor oath required. For personal study only.

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