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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optics for Arts, Architecture, and Archaeology IV - SYDDARTA: new methodology for digitization of deterioration estimation in paintings

✍ Scribed by Granero-Montagud, Luís; Pezzati, Luca; Targowski, Piotr; Portalés, Cristina; Pastor-Carbonell, Begoña; Ribes-Gómez, Emilio; Gutiérrez-Lucas, Antonio; Tornari, Vivi; Papadakis, Vassilis; Groves, Roger M.; Sirmacek, Beril; Bonazza, Alessandra; Ozga, Izabela; Vermeiren, Jan; van der Zanden, Koen; Föster, Matthias; Aswendt, Petra; Borreman, Albert; Ward, Jon D.; Cardoso, António; Aguiar, Luís; Alves, Filipa; Ropret, Polonca; Luzón-Nogué, José María; Dietz, Christian

Book ID: 121089718
Publisher: SPIE
Year: 2013
Weight: 415 KB
Volume: 8790
Category: Article
DOI: 10.1117/12.2020333

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