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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optics for Arts, Architecture, and Archaeology IV - Laser-induced plasma spectroscopy depth profile analysis: a contribution to authentication

✍ Scribed by Agresti, J.; Pezzati, Luca; Targowski, Piotr; Osticioli, I.; Mencaglia, A. A.; Siano, S.

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