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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical Manufacturing and Testing X - Roughness improvement in Active Fluid Jet Polishing (A-FJP) by optimization of the polishing pin

✍ Scribed by Falter, Manuela; Schinhaerl, Markus; Rascher, Rolf; Wuensche, Christine; Fähnle, Oliver W.; Williamson, Ray; Kim, Dae Wook

Book ID: 121488496
Publisher: SPIE
Year: 2013
Weight: 426 KB
Volume: 8838
Category: Article
DOI: 10.1117/12.2023007

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