✦ LIBER ✦

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Inspection and Metrology for Non-Optics Industries - Stokes parameters of reflected and scattered light by a rough surface

✍ Scribed by Jin, Lianhua; Takizawa, Kuniharu; Huang, Peisen S.; Yoshizawa, Toru; Harding, Kevin G.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

SPIE Proceedings [SPIE SPIE Optical Engi

✍ DeGroote Nelson, Jessica; Youngworth, Richard N.; Aikens, David M.; Sasián, José 📂 Article 📅 2009 🏛 SPIE ⚖ 271 KB

SPIE Proceedings [SPIE SPIE Optical Engi

✍ Bray, Michael; Burge, James H.; Fähnle, Oliver W.; Williamson, Ray 📂 Article 📅 2009 🏛 SPIE ⚖ 541 KB

SPIE Proceedings [SPIE SPIE Optical Engi

✍ Rockwell, Ken; Mouroulis, Pantazis Z.; Johnson, R. Barry; Mahajan, Virendra N. 📂 Article 📅 2009 🏛 SPIE ⚖ 132 KB

SPIE Proceedings [SPIE SPIE Optical Engi

✍ Chen, Yi-Yung; Whang, Allen Jong-Woei; Mouroulis, Pantazis Z.; Johnson, R. Barry 📂 Article 📅 2009 🏛 SPIE ⚖ 569 KB

SPIE Proceedings [SPIE SPIE Optical Engi

✍ Zhou, Ping; Burge, James H.; Fähnle, Oliver W.; Burge, James H.; Williamson, Ray 📂 Article 📅 2009 🏛 SPIE ⚖ 923 KB

SPIE Proceedings [SPIE SPIE Optical Engi

✍ Mahler, Ronald; Drummond, Oliver E.; Teichgraeber, Richard D. 📂 Article 📅 2009 🏛 SPIE ⚖ 234 KB