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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Manufacturing and Testing VIII - Limits for interferometer calibration using the random ball test

✍ Scribed by Zhou, Ping; Burge, James H.; Fähnle, Oliver W.; Burge, James H.; Williamson, Ray


Book ID
120244812
Publisher
SPIE
Year
2009
Weight
923 KB
Volume
7426
Category
Article

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