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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical System Alignment, Tolerancing, and Verification III - The cost of tolerancing

✍ Scribed by DeGroote Nelson, Jessica; Youngworth, Richard N.; Aikens, David M.; Sasián, José; Youngworth, Richard N.

Book ID: 120277501
Publisher: SPIE
Year: 2009
Weight: 271 KB
Volume: 7433
Category: Article
DOI: 10.1117/12.828433

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