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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Optical System Alignment, Tolerancing, and Verification VI - Practical method of cost-based tolerancing

✍ Scribed by Yabe, Akira; Sasián, José; Youngworth, Richard N.

No coin nor oath required. For personal study only.

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