SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Zoom Lenses IV - Method of zoom lenses aberrations analysis

✍ Scribed by Livshits, I.; Ezhova, K.; Zverev, V.; Luen, Nguen Van; Betensky, Ellis I.; Yamanashi, Takanori

• Book ID: 118209839
• Publisher: SPIE
• Year: 2012
• Weight: 567 KB
• Volume: 8488
• Category: Article
• DOI: 10.1117/12.928169